CHEMICALLY INDUCED CHARGE REDISTRIBUTION AT AL-GAAS INTERFACES
- Author
- BRILLSON LJ; BACHRACH RZ; BAUER RS; MCMENAMIN J
XEROX WEBSTER RES. CENT., WEBSTER NY 14580, USA - Source
- PHYS. REV. LETTERS; USA; DA. 1979; VOL. 42; NO 6; PP. 397-401; BIBL. 26 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- INTERFACE INTERFACE METAL SEMICONDUCTEUR BARRIERE SCHOTTKY EMISSION PHOTOELECTRONIQUE DEPLACEMENT CHIMIQUE EMISSION ELECTRONIQUE AUGER CONTACT ELECTRIQUE CONTACT METAL SEMICONDUCTEUR PHYSIQUE SOLIDE
- Keyword (en)
- INTERFACES SCHOTTKY BARRIER PHOTOELECTRON EMISSION CHEMICAL SHIFT AUGER EMISSION ELECTRIC CONTACT SEMICONDUCTOR METAL CONTACT SOLID PHYSICS
- Keyword (es)
- FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7930360171
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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