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SYSTEM CUTS COST OF LSI TESTING

Author
BROWNSTEIN R
SAN FRANCISCO REGIONAL BUREAU, USA
Source
ELECTRONICS; USA; DA. 1979; VOL. 52; NO 1; PP. 161-162
Document type
Article
Language
English
Keyword (fr)
CIRCUIT INTEGRE CIRCUIT LSI APPAREILLAGE ESSAI COUT ELECTRONIQUE
Keyword (en)
INTEGRATED CIRCUIT LSI CIRCUIT TESTING EQUIPMENT COST ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7930451610

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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