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ROENTGENOGRAFISCHE UNTERSUCHUNG DES DEBYE-WALLER-FAKTORS UND DER GITTERKONSTANTEN VON V3SI-PULVER IM TEMPERATURBEREICH VON 25 K BIS 1000 K.

Other title
ETUDE RX DU FACTEUR DEBYE-WALLER ET DES PARAMETRES CRISTALLINS DE V3SI EN POUDRE DANS LE DOMAINE DE TEMPERATURE 25-1000 K. (fr)
Author
FOERSTERLING G; HEGENBARTH E
TECH. UNIV. DRESDEN SEKT. PHYS., 8027 DRESDEN, DDR
Source
KRISTALL U. TECH.; DDR; DA. 1978; VOL. 13; NO 6; PP. 737-746; ABS. ENG; BIBL. 12 REF.
Document type
Article
Language
German
Keyword (fr)
VANADIUM ALLIAGE SILICIUM ALLIAGE PARAMETRE CRISTALLIN DILATATION THERMIQUE TEMPERATURE ANALYSE DIFFRACTION RX FACTEUR DEBYE WALLER VANADIUM ALLIAGE SILICIUM ALLIAGE ALLIAGE SILICIUM ALLIAGE VANADIUM ALLIAGE METAL TRANSITION DYNAMIQUE RETICULAIRE DIFFRACTION RX HAUTE TEMPERATURE BASSE TEMPERATURE POUDRE ALLIAGE SILICIUM VANADIUM VANADIUM 50-100 SILICIUM 20-50 COMPOSITION ATOMIQUE CRISTALLOGRAPHIE PHYSIQUE SOLIDE METALLURGIE
Keyword (en)
VANADIUM ALLOY SILICON ALLOY LATTICE PARAMETERS THERMAL EXPANSION TEMPERATURE DEBYE WALLER FACTOR ALLOYS LATTICE DYNAMICS X-RAY DIFFRACTION ANALYSIS HIGH TEMPERATURE LOW TEMPERATURE POWDER CRISTALLOGRAPHY SOLID PHYSICS METALLURGY
Keyword (es)
CRISTALOGRAFIA FISICA DEL ESTADO CONDENSADO METALURGIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy

Discipline
Metals. Metallurgy Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7940069476

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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