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DETERMINATION OF TRACE ELEMENTS IN LIGHT ELEMENT MATRICES BY X-RAY FLUORESCENCE SPECTROMETRY WITH INCOHERENT SCATTERED RADIATION AS AN INTERNAL STANDARD

Author
GIAUQUE RD; GARRETT RB; GODA LY
UNIV. CALIFORNIA LAWRENCE BERKELEY LAB., BERKELEY CA 94720, USA
Source
ANAL. CHEM.; USA; DA. 1979; VOL. 51; NO 4; PP. 511-516; BIBL. 12 REF.
Document type
Article
Language
English
Keyword (fr)
ELEMENT TRACE DOSAGE ANALYSE QUANTITATIVE EFFET CONSTITUANT MAJEUR CORRECTION ETALON INTERNE SPECTROMETRIE FLUORESCENCE RX CHIMIE ANALYTIQUE
Keyword (en)
TRACE ELEMENT ANALYTICAL DETERMINATION QUANTITATIVE ANALYSIS MAJOR CONSTITUENT EFFECT CORRECTIONS INTERNAL STANDARD X RAY FLUORESCENCE SPECTROMETRY ANALYTICAL CHEMISTRY
Keyword (es)
QUIMICA ANALYTICA
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry

Discipline
General chemistry and physical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7960300759

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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