EFFECT OF COLD DEFORMATION AND ANNEALING ON THE MICROSTRUCTURE OF ELECTRON-BEAM-EVAPORATED NI-ZRO2 CONDENSATES
- Other title
- EFFET D'UN ECROUISSAGE ET D'UN RECUIT SUR LA MICROSTRUCTURE DES FILMS DE NI-ZRO2 FORMES PAR EVAPORATION ELECTRONIQUE (fr)
- Author
- JACOBSON BE; DEMCHISHIN AV; MOVCHAN BA
STANFORD UNIV., DEP. MATER. SCI. ENG.,STANFORD CA 94305,USA - Source
- THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1979; VOL. 63; NO 1; PP. 93
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- DEPOT PROJECTION REVETEMENT METALLIQUE METAL RENFORCE DISPERSION DURCISSEMENT DEFORMATION RECUIT NICKEL ZIRCONIUM OXYDE MICROSCOPIE ELECTRONIQUE METALLURGIE
- Keyword (en)
- PROJECTION DEPOSITION METAL COATING DISPERSION STRENGTHENED METAL STRAIN HARDENING ANNEALING NICKEL ZIRCONIUM OXIDE ELECTRON MICROSCOPY METALLURGY
- Keyword (es)
- METALURGIA
- Classification
- Discipline
- Metals. Metallurgy
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8000233677
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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