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MEASUREMENT ARRANGEMENT FOR DIRECT CAPACITANCE/SURFACE POTENTIAL RECORDING ON M.O.S. CAPACITOR

Author
LIGTENBERG HCG; SNIJDER J
GRONINGEN STATE UNIV., DEP. APPLIED PHYS.,GRONINGEN 9747,NLD
Source
ELECTRON. LETTERS; GBR; DA. 1979; VOL. 15; NO 17; PP. 523-524; BIBL. 5 REF.
Document type
Article
Language
English
Keyword (fr)
STRUCTURE COMPOSEE STRUCTURE MOS CAPACITE ELECTRIQUE COURANT FUITE POTENTIEL SURFACE METHODE MESURE ELECTRONIQUE
Keyword (en)
COMPOUNDED STRUCTURE MOS STRUCTURE CAPACITANCE LEAKAGE CURRENT SURFACE POTENTIAL MEASUREMENT METHOD ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030003288

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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