DETERMINATION OF THE STANDARD DEVIATION OF HEIGHT ON A ROUGH SURFACE USING INTERFERENCE MICROSCOPY
- Author
- CHANDLEY PJ
IMPERIAL COLL.,LONDON SW7,GBR - Source
- OPT. QUANTUM ELECTRON.; GBR; DA. 1979; VOL. 11; NO 5; PP. 407-412; BIBL. 5 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- SURFACE RUGUEUSE DIFFUSION ONDE ONDE ELECTROMAGNETIQUE RUGOSITE MICROSCOPIE INTERFERENTIELLE PROBLEME INVERSE MESURE FRANGE INTERFERENCE MICROSCOPIE OPTIQUE DIMENSION DIFFUSION OPTIQUE INTERFERENCE OPTIQUE INTERFEROMETRIE OPTIQUE ELECTRONIQUE METROLOGIE PHYSIQUE THEORIQUE
- Keyword (en)
- ROUGH SURFACE SCATTERING ELECTROMAGNETIC WAVES ROUGHNESS INTERFERENCE MICROSCOPY INVERSE PROBLEM MEASUREMENT INTERFERENCE FRINGE OPTICAL MICROSCOPY DIMENSIONS OPTICAL SCATTERING OPTICAL INTERFERENCE OPTICAL INTERFEROMETRY ELECTRONICS MEASUREMENT SCIENCE THEORETICAL PHYSICS
- Keyword (es)
- ELECTRONICA METROLOGIA FISICA TEORICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Electronics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8030013089
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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