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A NEW ELECTROSTATIC DISCHARGE FAILURE MODE

Author
WOODS MH; GEAR G
INTEL CORP.,SANTA CLARA CA,USA
Source
IEEE TRANS. ELECTRON. DEVICES; USA; DA. 1979; VOL. 26; NO 1; PP. 16-21; BIBL. 5 REF.
Document type
Article
Language
English
Keyword (fr)
CIRCUIT INTEGRE CIRCUIT LSI CIRCUIT MOS DEFAILLANCE TENSION DISRUPTIVE REFRIGERANT RAYONNEMENT UV FIABILITE DECHARGE ELECTRIQUE ENCAPSULATION BOITIER IRRADIATION EAU REVETEMENT RINCAGE ELECTRONIQUE
Keyword (en)
INTEGRATED CIRCUIT LSI CIRCUIT MOS CIRCUIT FAILURES BREAKDOWN VOLTAGE ULTRAVIOLET RADIATION RELIABILITY ELECTRIC DISCHARGE PACKAGE IRRADIATION WATER COATINGS RINSING ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030031819

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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