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A DIFFERENTIALLY PUMPED LOW-ENERGY ION BEAM SYSTEM FOR AN ULTRAHIGH-VACUUM ATOM-PROBE FIELD-ION MICROSCOPE

Author
AMANO J; SEIDMAN DN
CORNELL UNIV. DEP. MATERIALS SCI. ENG.,ITHACA NY 14853,USA
Source
REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1979; VOL. 50; NO 9; PP. 1125-1129; BIBL. 18 REF.
Document type
Article
Language
English
Keyword (fr)
MICROSCOPIE IONIQUE FAISCEAU ION MICROSCOPE POMPAGE ULTRAVIDE METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
ION MICROSCOPY MICROSCOPE PUMPING ULTRAHIGH VACUUM MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030070085

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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