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AN APPARATUS FOR X-RAY DIFFRACTION BY OSCILLATION TECHNIQUE

Author
KIMURA M
TOYOTA CENTRAL RESEARCH & DEVELOPMENT LAB. INC.,HISAKATA TEMPAKU-KU NAGOYA 468,JPN
Source
TRANS. JAP. INST. METALS; JPN; DA. 1979; VOL. 20; NO 4; PP. 181-185; BIBL. 4 REF.
Document type
Article
Language
English
Keyword (fr)
DIFFRACTOMETRIE RX APPAREILLAGE OSCILLATION METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
X RAY DIFFRACTOMETRY OSCILLATIONS MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030079674

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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