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A DETERMINATION OF INTERFACE STATE ENERGY DURING THE CAPTURE OF ELECTRONS AND HOLES USING DLTS

Author
WANG KL
GENERAL ELECTRIC CORP.,SCHENECTADY NY 12301,USA
Source
I.E.E.E. TRANS. ELECTRON DEVICES; USA; DA. 1979; VOL. 26; NO 5; PP. 819-821; BIBL. 12 REF.
Document type
Article
Language
English
Keyword (fr)
PORTEUR CHARGE CAPTURE PORTEUR CHARGE ELECTRON TROU ETAT ELECTRONIQUE INTERFACE NIVEAU PROFOND METHODE MESURE STRUCTURE MOS ELECTRONIQUE
Keyword (en)
CHARGE CARRIER ELECTRONS HOLE INTERFACE ELECTRON STATE DEEP LEVEL MEASUREMENT METHOD MOS STRUCTURE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030094416

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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