ELECTRICAL CONDUCTION MECHANISMS IN FEF3 THIN FILMS
- Author
- LASCAUD M; LACHTER A; SALARDENNE J; BARRIERE AS
UNIV. BORDEAUX I, LAB. RECH. ELECTROTECH. PHYS. SOLIDE,TALENCE 33405,FRA - Source
- THIN SOLID FILMS; NLD; DA. 1979; VOL. 59; NO 3; PP. 353-360; BIBL. 20 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- COMPOSE METAL TRANSITION COUCHE MINCE CONDUCTIVITE ELECTRIQUE ETAT LOCALISE CONDUCTIVITE SAUT EFFET TUNNEL MOBILITE PORTEUR CHARGE MATERIAU ANTIFERROMAGNETIQUE STRUCTURE MIM CARACTERISTIQUE COURANT TENSION TEMPERATURE HAUTE TEMPERATURE PHOTOCONDUCTIVITE FLUORURE COMPOSE FER ETAT ELECTRONIQUE INTERFACE FLUORURE FER PHYSIQUE SOLIDE ELECTRONIQUE
- Keyword (en)
- THIN FILM ELECTRICAL CONDUCTIVITY LOCALIZED STATE HOPPING CONDUCTIVITY TUNNEL EFFECT CHARGE CARRIER MOBILITY MIM STRUCTURE VOLTAGE CURRENT CURVE TEMPERATURE HIGH TEMPERATURE PHOTOCONDUCTIVITY FLUORIDES INTERFACE ELECTRON STATE SOLID PHYSICS ELECTRONICS
- Keyword (es)
- FISICA DEL ESTADO CONDENSADO ELECTRONICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Electronics Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8030115472
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0040-6090(79)90445-0 
https://dx.doi.org/10.1016/0040-6090(79)90445-0
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