Pascal and Francis Bibliographic Databases

Help

Permanent link : http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL8030155665

Export

Selection :

ON FAILURE PATTERNS IN REDUNDANT SYSTEMS

Author
BACKER PW
ELECTRON. INST.,LYNGBY 2800,DNK
Source
INTERNATIONAL JOINT CONFERENCE ON PATTERN RECOGNITION. 4/1978/KYOTO; JPN; DA. S.D.; PP. 480-482; BIBL. 5 REF.
Document type
Conference Paper
Language
English
Keyword (fr)
SYSTEME REDONDANT RECONNAISSANCE FORME FORME PANNE MATHEMATIQUES APPLIQUEES
Keyword (en)
REDUNDANT SYSTEM PATTERN RECOGNITION APPLIED MATHEMATICS
Keyword (es)
MATEMATICAS APPLICADAS
Classification
Pascal
001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics

Discipline
Mathematics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030155665

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web