THE QUANTUM YIELD OF SILICON IN THE VISIBLE
- Author
- GEIST J; ZALEWSKI EF
NATIONAL BUREAU STANDARDS,WASHINGTON DC 20234,USA - Source
- APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1979; VOL. 35; NO 7; PP. 503-506; BIBL. 27 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DETECTEUR RAYONNEMENT SILICIUM RENDEMENT QUANTIQUE RAYONNEMENT VISIBLE DISPOSITIF PHOTOELECTRIQUE PHOTOCONDUCTEUR PHOTOMETRIE SEMICONDUCTEUR ETALONNAGE ETALON METROLOGIE PHYSIQUE THEORIQUE
- Keyword (en)
- RADIATION DETECTOR SILICON QUANTUM YIELD VISIBLE RADIATION PHOTOELECTRIC CELL PHOTOCONDUCTOR MATERIALS PHOTOMETRY SEMICONDUCTOR MATERIALS CALIBRATION STANDARD MEASUREMENT SCIENCE THEORETICAL PHYSICS
- Keyword (es)
- METROLOGIA FISICA TEORICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8030167485
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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