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A TECHNIQUE FOR ANALYSIS OF DOUBLE EXPOSURE SPECKLE PHOTOGRAPHY

Author
SVETLIK J
TECH. UNIV., DEP. PHYS.,BRNO 61100,CSK
Source
OPTIK; DEU; DA. 1980; VOL. 55; NO 3; PP. 303-314; ABS. GER; BIBL. 6 REF.
Document type
Article
Language
English
Keyword (fr)
METHODE DOUBLE EXPOSITION DEPLACEMENT PHOTOGRAPHIE INTERFEROMETRIE OPTIQUE INTERFEROMETRIE SPECKLE ENREGISTREMENT PHOTOGRAPHIQUE PHOTOGRAPHIE SPECKLE METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
DOUBLE EXPOSURE METHOD PHOTOGRAPHY OPTICAL INTERFEROMETRY SPECKLE INTERFEROMETRY PHOTOGRAPHIC RECORDING SPECKLE PHOTOGRAPHY MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030301955

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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