DETERMINING OUTER LAYER REGISTRATION VIA A CONCENTRICITY MEASURING MICROSCOPE
- Author
- RALPH NJ; KERN RW
IBM,OWEGO NY,USA - Source
- ELECTRON. PACKAG. PRODUCT.; USA; DA. 1979; VOL. 19; NO 11; PP. 143-145
- Document type
- Article
- Language
- English
- Keyword (fr)
- CIRCUIT IMPRIME CIRCUIT IMPRIME MULTICOUCHE CONTROLE QUALITE TROU METALLISE PERCAGE MICROSCOPIE OPTIQUE SYSTEME OPTIQUE ELECTRONIQUE
- Keyword (en)
- PRINTED CIRCUIT MULTILAYERED PRINTED CIRCUIT BOARD QUALITY CONTROL PLATED THROUGH HOLE BORING OPTICAL MICROSCOPY OPTICAL SYSTEM ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8030337403
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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Istex access
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Europe PubMed Central access
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