Pascal and Francis Bibliographic Databases

Help

Export

Selection :

Permanent link
http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL8030339586

LINEAR IMAGING OF STRONG PHASE OBJECTS USING ASYMMETRICAL DETECTORS IN STEM

Author
WADDELL EM; CHAPMAN JN
UNIV. GLASGOW, DEP. NATURAL PHILOSOPHY,GLASGOW G12 8QQ SCOTLAND,GBR
Source
OPTIK; DEU; DA. 1979; VOL. 54; NO 2; PP. 83-96; ABS. GER; BIBL. 14 REF.
Document type
Article
Language
English
Keyword (fr)
MICROSCOPIE ELECTRONIQUE MICROSCOPE TRANSMISSION MICROSCOPE BALAYAGE OBJET PHASE SYSTEME LINEAIRE METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
ELECTRON MICROSCOPY TRANSMISSION MICROSCOPE SCANNING MICROSCOPE PHASE OBJECT LINEAR SYSTEM MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030339586

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web