ELECTRICAL AND STRUCTURAL PROPERTIES OF CR-SIO THIN FILMS
- Author
- FRONZ V; ROESNER B; STORCH W
PREH-WERKE,BAD NEUSTADT SAALE 8740,DEU - Source
- THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 65; NO 1; PP. 33-43; BIBL. 15 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- CONDUCTIVITE ELECTRIQUE COUCHE MINCE COMPOSE METAL TRANSITION DIFFRACTION RX EFFET TUNNEL OXYDE CHROME SILICIUM PHYSIQUE SOLIDE
- Keyword (en)
- ELECTRICAL CONDUCTIVITY THIN FILM X-RAY DIFFRACTION ANALYSIS TUNNEL EFFECT SOLID PHYSICS
- Keyword (es)
- FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8030344682
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0040-6090(80)90054-1 
https://dx.doi.org/10.1016/0040-6090(80)90054-1
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