FUNCTION TESTING OF BIPOLAR IC'S AND LSI'S WITH THE STROBOSCOPIC SCANNING ELECTRON MICROSCOPE
- Author
- FUJIOKA H; NAKAMAE K; URA K
OSAKA UNIV.,OSAKA,JPN - Source
- I.E.E.E. J. SOLID-STATE CIRCUITS; USA; DA. 1980; VOL. 15; NO 2; PP. 177-183; BIBL. 13 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- CIRCUIT INTEGRE CIRCUIT LSI ESSAI FONCTIONNEL MICROSCOPIE ELECTRONIQUE MICROSCOPE BALAYAGE STROBOSCOPIE ELECTRONIQUE
- Keyword (en)
- INTEGRATED CIRCUIT LSI CIRCUIT FUNCTIONAL TEST ELECTRON MICROSCOPY SCANNING MICROSCOPE STROBOSCOPY ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8030365491
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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