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DETERMINATION OF THE THICKNESS AND THE REFRACTIVE INDEX OF V2O5 THIN FILMS FROM REFLECTANCE INTERFERENCE SPECTRA

Author
SULI A; MICHAILOVITS L; HEVESI I
ATTILA JOZSEF UNIV., INST. EXP. PHYS.,SZEGED,HUN
Source
ACTA PHYS. CHEM.; HUN; DA. 1979; VOL. 25; NO 1-2; PP. 29-41; ABS. RUS; BIBL. 8 REF.
Document type
Article
Language
English
Keyword (fr)
COUCHE MINCE INDICE REFRACTION EPAISSEUR INTERFERENCE REFLEXION OPTIQUE COMPOSE METAL TRANSITION OXYDE VANADIUM PHYSIQUE SOLIDE
Keyword (en)
THIN FILM REFRACTIVE INDEX THICKNESS INTERFERENCE OPTICAL REFLECTION SOLID PHYSICS
Keyword (es)
FISICA DEL ESTADO CONDENSADO
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030368392

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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