A NEW GRAZING INCIDENCE SPECTROMETER AND EXTREME ULTRAVIOLET SPECTRA OF LIGHT IMPURITY IONS IN LINEAR PINCH PLASMAS
- Author
- FUKUDA K; SUEMITSU H; WANI K
KYOTO UNIV., FAC. ENG., DEP. ENG. PHYS.,KYOTO 606,JPN - Source
- JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1980; VOL. 19; NO 3; PP. 537-545; BIBL. 24 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- STRICTION LINEAIRE IMPURETE DIAGNOSTIC PLASMA SPECTROMETRIE OPTIQUE SPECTROMETRIE UV HELIUM SPECTROMETRE PHYSIQUE DES PLASMAS
- Keyword (en)
- LINEAR PINCH IMPURITIES PLASMA DIAGNOSTIC OPTICAL SPECTROMETRY OPTICAL SPECTROSCOPY ULTRAVIOLET SPECTROMETRY ULTRAVIOLET SPECTROSCOPY HELIUM SPECTROMETER PLASMA PHYSICS
- Keyword (es)
- FISICA DE LAS PLASMAS
- Classification
- Discipline
- Atomic and molecular physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8030396801
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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