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ZUVERLAESSIGKEITSPROBLEME BEI SPEICHERSCHALTKREIS U 253

Other title
PROBLEMES DE FIABILITE CONCERNANT LA MEMOIRE U 253 (fr)
Author
GROSSE D; JUNGHANS B
VE INST. MIKROELEKTRON.,DRESDEN 8080,DDR
Source
NACHR.-TECH., ELEKTRON.; DDR; DA. 1980; VOL. 30; NO 3; PP. 112-115; ABS. RUS/ENG; BIBL. 8 REF.
Document type
Article
Language
German
Keyword (fr)
FIABILITE MEMOIRE CIRCUIT INTEGRE CIRCUIT INTEGRE MONOLITHIQUE CIRCUIT LSI MEMOIRE U 253 ELECTRONIQUE
Keyword (en)
RELIABILITY MEMORY INTEGRATED CIRCUIT MONOLITHIC INTEGRATED CIRCUIT LSI CIRCUIT ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030435814

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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