Pascal and Francis Bibliographic Databases

Help

Export

Selection :

Permanent link
http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL8030458132

MEASUREMENT OF ELECTRIC FIELD STRENGTHS IN A WAVEGUIDE BY MEANS OF THE DYNAMIC STARK EFFECT IN HYDROGEN AND NEUTRAL HELIUM SPECTRAL LINES

Author
BOEHM G; HIMMEL G
RUHR-UNIV., INST. EXPERIMENTALPHYS.,BOCHUM 4630,DEU
Source
APPL. PHYS.; ISSN 0340-3793; DEU; DA. 1980; VOL. 21; NO 4; PP. 313-318; BIBL. 9 REF.
Document type
Article
Language
English
Keyword (fr)
GUIDE ONDE CHAMP ELECTRIQUE MESURE DECHARGE ELECTRIQUE HYDROGENE SPECTROMETRIE OPTIQUE HELIUM RAIE SPECTRALE EFFET STARK DECHARGE HYPERFREQUENCE PHYSIQUE DES PLASMAS
Keyword (en)
WAVEGUIDE ELECTRICAL FIELD MEASUREMENT ELECTRIC DISCHARGE HYDROGEN OPTICAL SPECTROMETRY OPTICAL SPECTROSCOPY HELIUM SPECTRAL LINE STARK EFFECT MICROWAVE DISCHARGE PLASMA PHYSICS
Keyword (es)
FISICA DE LAS PLASMAS
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics

Discipline
Atomic and molecular physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030458132

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web