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LONG-TERM TEMPORAL AND SCANNING CHARACTERISTICS OF A DOUBLE-BEAM DIODE-LASER SPECTROMETER

Author
ENG RS; SIMPSON C; MANTZ AW; VENKATESH CG
LASER ANALYTICS INC.,BEDFORDS MA 01730,USA
Source
APPL. OPT.; USA; DA. 1980; VOL. 19; NO 12; PP. 1973-1979; BIBL. 3 REF.
Document type
Article
Language
English
Keyword (fr)
SPECTROMETRIE OPTIQUE LASER SPECTROMETRE INTERFERENTIEL INTERFEROMETRE 2 ONDES TRAITEMENT SIGNAL TRAITEMENT NUMERIQUE METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
OPTICAL SPECTROMETRY OPTICAL SPECTROSCOPY LASER INTERFERENCE SPECTROMETER TWO BEAM INTERFEROMETER SIGNAL PROCESSING DIGITAL PROCESSING MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030463232

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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