SYSTEMATIC ELIMINATION OF THIRD ORDER ABERRATIONS IN ELECTRON BEAM SCANNING SYSTEM
- Author
- HOSOKAWA T
NIPPON TELEGRAPH TELEPHONE PUBLIC CORP.,TOKYO 180,JPN - Source
- OPTIK; DEU; DA. 1980; VOL. 56; NO 1; PP. 21-30; ABS. GER; BIBL. 9 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- FAISCEAU ELECTRON BALAYAGE FOCALISATION DEFLEXION ABERRATION OPTIQUE FOCALISATION MAGNETIQUE LENTILLE MAGNETIQUE SUPPRESSION OPTIQUE ELECTRONIQUE ELECTRONIQUE
- Keyword (en)
- SCANNING FOCUSING DEFLECTION OPTICAL ABERRATION MAGNETIC FOCUSING MAGNETIC LENS SUPPRESSION ELECTRON OPTICS ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8030463399
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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