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LOG-RANK VS X TEST FOR EXPONENTIALITY

Author
WALKER CC; MCLEAVEY DW; ROGERS W
UNIV. CONNECTICUT, DEP. MANAGEMENT ADMINISTRATIVE SCI.,STORRS CT 06268,USA
Source
I.E.E.E. TRANS. RELIABIL.; USA; DA. 1980; VOL. 29; NO I; PP. 45-48; BIBL. 6 REF.
Document type
Article
Language
English
Keyword (fr)
TEST AJUSTEMENT LOI EXPONENTIELLE FIABILITE TEST STATISTIQUE RECHERCHE OPERATIONNELLE MATHEMATIQUES APPLIQUEES
Keyword (en)
GOODNESS OF FIT TEST EXPONENTIAL DISTRIBUTION RELIABILITY STATISTICAL TEST OPERATIONAL RESEARCH APPLIED MATHEMATICS
Keyword (es)
MATEMATICAS APPLICADAS
Classification
Pascal
001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics

Discipline
Mathematics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8030465730

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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