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CONSTANT INTENSITY CURVES IN CRITICAL SCATTERING AND VON LAUE DIAGRAMS

Author
KOCINSKI J
WARSAW TECH. UNIV., INST. PHYS.,WARSZAWA 00-662,POL
Source
ACTA CRYSTALLOGR., SECT. A, CRYST. PHYS., DIFFR., THEOR. GEN. CRYSTALLOGR.; ISSN 0567-7394; DNK; DA. 1979; VOL. 35; NO 5; PP. 859; BIBL. 14 REF.
Document type
Article
Language
English
Keyword (fr)
DIFFUSION RX METHODE LAUE DIFFUSION CRITIQUE INTENSITE MONOCRISTAL ETUDE THEORIQUE CRISTALLOGRAPHIE
Keyword (en)
X RAY SCATTERING LAUE METHOD CRITICAL SCATTERING INTENSITY SINGLE CRYSTAL THEORETICAL STUDY CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8040094525

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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