DETERMINATION OF THE CRYSTALLITE SIZE IN EPITAXIAL LAYERS OF PBTE BY MEANS OF X-RAY DIFFRACTION ROCKING CURVES
- Author
- SCHAEFER P; BERGER H
HUMBOLDT-UNIV. BERLIN, SEKT. PHYS.,BERLIN 104,DDR - Source
- KRISTALL U. TECH.; DDR; DA. 1979; VOL. 14; NO 6; PP. 711-715; ABS. GER; BIBL. 3 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- METHODE OSCILLATION ETUDE EXPERIMENTALE COUCHE EPITAXIQUE PLOMB COMPOSE TELLURURE CRISTALLITE DIMENSION MICROSTRUCTURE METHODE CALCUL HETEROEPITAXIE ANALYSE DIFFRACTION RX ANALYSE MET PLOMB TELLURURE COMPOSE MINERAL SUPPORT NACL CRISTALLOGRAPHIE
- Keyword (en)
- OSCILLATION METHOD EXPERIMENTAL STUDY EPITAXIAL FILM LEAD COMPOUND TELLURIDES CRYSTALLITES DIMENSIONS MICROSTRUCTURE ULTRASTRUCTURE CALCULATING METHOD HETEROEPITAXY INORGANIC COMPOUND CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8040113183
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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