A MODEL FOR HYDROGEN ISOTOPE BACKSCATTERING, TRAPPING AND DEPTH PROFILES IN CARBON AND AMORPHOUS SILICON
- Author
- COHEN SA; MCCRACKEN GM
PRINCETON UNIV., PLASMA PHYS. LAB.,PRINCETON NJ 08544,USA - Source
- J. NUCL. MATER.; ISSN 0022-3115; NLD; DA. 1979; VOL. 84; NO 1-2; PP. 157-166; BIBL. 30 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- CARBONE SILICIUM ETAT SOLIDE ETAT AMORPHE IRRADIATION ION PIEGEAGE IMPURETE RETRODIFFUSION DISTRIBUTION IMPURETE PROFONDEUR PENETRATION ETUDE THEORIQUE STRICTION TOROIDALE STRICTION TOKAMAK DIAGNOSTIC PLASMA INTERACTION SOLIDE PLASMA PIEGEAGE PARTICULE HYDROGENE DEUTERIUM MODELE MATHEMATIQUE SONDE CRISTALLOGRAPHIE PHYSIQUE DES PLASMAS
- Keyword (en)
- CARBON SILICON SOLID STATE AMORPHOUS STATE ION IRRADIATION IMPURITY TRAPPING BACKSCATTERING IMPURITY DISTRIBUTION PENETRATION DEPTH THEORETICAL STUDY TOROIDAL PINCH PLASMA DIAGNOSTIC SURFACE PLASMA INTERACTION PARTICLE TRAPPING HYDROGEN DEUTERIUM MATHEMATICAL MODELS PROBE CRISTALLOGRAPHY PLASMA PHYSICS
- Keyword (es)
- CRISTALOGRAFIA FISICA DE LAS PLASMAS
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Atomic and molecular physics Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8040115536
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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