MEASUREMENT OF MICROCRYSTAL SIZE BY MEANS OF DIFFRACTION OF X-RAYS
- Author
- PUCALKA V
SCH. MINING,OSTRAVA 70833,CSK - Source
- KRIST. TECH.; ISSN 0023-4753; DDR; DA. 1979; VOL. 14; NO 8; PP. 999-1004; ABS. GER; BIBL. 1 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DIFFRACTOMETRIE RX CRISTALLITE DIMENSION PROFIL RAIE SPECTRALE METHODE MESURE ETUDE EXPERIMENTALE CRISTALLOGRAPHIE
- Keyword (en)
- X RAY DIFFRACTOMETRY CRYSTALLITES DIMENSIONS SPECTRAL LINE PROFILE MEASUREMENT METHOD EXPERIMENTAL STUDY CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8040197439
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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