CARACTERISATION ET COMPARAISON PAR SPECTROSCOPIE AUGER ET DIFFRACTION D'ELECTRONS LENTS DE SURFACES DE SILICIUM MONOCRISTALLIN, AMORPHE ET HYDROGENE
- Author
- ALLIE G; LAUROZ C; CHENEVAS PAULE A
C.N.R.S., LAB. SPECTROM. PHYS.,GRENOBLE 38041,FRA - Source
- APPL. SURF. SCI.; NLD; DA. 1980; VOL. 4; NO 2; PP. 221-233; ABS. ENG; BIBL. 16 REF.
- Document type
- Article
- Language
- French
- Keyword (fr)
- SILICIUM SILICIUM ALLIAGE STRUCTURE SURFACE ETAT AMORPHE SEGREGATION SURFACE FACE CRISTALLINE HYDROGENE ADSORBAT MINERAL ADSORPTION GAZ SOLIDE ADSORBANT METALLIQUE SPECTROMETRIE AUGER ANALYSE DEL ETAT ADSORBE ETAT CRISTALLIN METHODE ETUDE DIFFRACTOMETRIE ELECTRON LENT ORIENTATION CRISTALLINE SEMICONDUCTEUR ADSORBANT MINERAL SURFACE SILICIUM!SUB HYDROGENE!ACT SILICIUM ALLIAGE HYDROGENE CRISTALLOGRAPHIE CHIMIE PHYSIQUE CHIMIE GENERALE
- Keyword (en)
- SILICON SILICON ALLOY SURFACE STRUCTURE AMORPHOUS STATE SURFACE SEGREGATION CRYSTAL FACE HYDROGEN INORGANIC ADSORBATE GAS SOLID ADSORPTION METALLIC ADSORBENT AUGER ELECTRON SPECTROMETRY AUGER SPECTROSCOPY ADSORBED STATE CRYSTALLINE STATE INVESTIGATION METHOD LOW ENERGY ELECTRON DIFFRACTOMETRY CRYSTAL ORIENTATION SEMICONDUCTOR MATERIALS INORGANIC ADSORBENT SURFACE CRISTALLOGRAPHY PHYSICAL CHEMISTRY GENERAL CHEMISTRY
- Keyword (es)
- CRISTALOGRAFIA QUIMICA FISICA QUIMICA GENERAL
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- General chemistry and physical chemistry Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8040283579
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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