SYSTEM FOR CONTINUOUS MONITORING OF POINT DEFECT CONCENTRATIONS DURING IRRADIATIONS AND ANNEALS
- Author
- JACKSON JJ; RYAN EA
ARGONNE NATIONAL LAB.,ARGONNE IL 60439,USA - Source
- REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1979; VOL. 50; NO 10; PP. 1193-1200; BIBL. 26 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DEFAUT IRRADIATION DEFAUT PONCTUEL METAL IRRADIATION RECUIT DENSITE DEFAUT CRISTALLIN APPAREILLAGE CONTROLE PROCESSUS BASSE TEMPERATURE METHODE ELECTRIQUE CRISTALLOGRAPHIE
- Keyword (en)
- IRRADIATION DEFECT POINT DEFECT METAL IRRADIATION ANNEALING CRYSTAL DEFECT DENSITY LOW TEMPERATURE ELECTRICAL METHODS CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8040354758
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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