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DETERMINATION OF THE SURFACE ROUGHNESS OF PASSIVE FILM BY GAS ADSORPTION TECHNIQUES

Author
TAKAISHI T; YUSA A; OHGUSHI T
TOYOHASHI UNIV. TECHNOL., DEP. MATERIAL SCI.,TOYOHASHI 440,JPN
Source
J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1979; VOL. 126; NO 10; PP. 1720-1722; BIBL. 4 REF.
Document type
Article
Language
English
Keyword (fr)
SILICIUM COMPOSE GALLIUM COMPOSE OXYDE SURFACE COUCHE MINCE TOPOGRAPHIE RUGOSITE PASSIVATION ETUDE EXPERIMENTALE SILICIUM OXYDE GALLIUM OXYDE COMPOSE MINERAL SUPPORT SI SUPPORT GAAS CRISTALLOGRAPHIE
Keyword (en)
SILICON COMPOUND GALLIUM COMPOUND OXIDES SURFACE THIN FILM TOPOGRAPHY ROUGHNESS PASSIVATION EXPERIMENTAL STUDY SILICA GALLIUM OXIDE INORGANIC COMPOUND CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8040371069

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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