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COMPARISON OF SENSITIVITY COEFFICIENTS FOR SPARK-SOURCE MASS SPECTROMETRY DETERMINED WITH PHOTOGRAPHIC AND ELECTRICAL DETECTION

Author
VAN HOYE E; GIJBELS R; ADAMS F
UNIV. ANTWERP, DEP. CHEM.,WILRIJK 2610,BEL
Source
ANAL. CHIM. ACTA; ISSN 0003-2670; NLD; DA. 1980; VOL. 115; PP. 239-248; BIBL. 18 REF.
Document type
Article
Language
English
Keyword (fr)
SPECTROMETRIE MASSE ETINCELAGE ANALYSE CHIMIQUE SENSIBILITE ETUDE COMPARATIVE HAUTE FREQUENCE PHOTOGRAPHIE METHODE ELECTRIQUE DETECTEUR ACIER FER!SUB METAL!ANA CHIMIE ANALYTIQUE
Keyword (en)
MASS SPECTROMETRY MASS SPECTROSCOPY SPARK MACHINING CHEMICAL ANALYSIS CHEMICAL COMPOSITION SENSITIVITY COMPARATIVE STUDY HIGH FREQUENCY PHOTOGRAPHY ELECTRICAL METHODS DETECTOR STEEL ANALYTICAL CHEMISTRY
Keyword (es)
QUIMICA ANALYTICA
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry

Discipline
General chemistry and physical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8060279074

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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