A MODEL FOR THE WIDTH DEPENDENCE OF ELECTROMIGRATION LIFETIMES IN ALUMINIUM THIN-FILM STRIPES
- Other title
- MODELE POUR LA VARIATION AVEC L'EPAISSEUR DES DUREES DE VIE D'ELECTRODIFFUSION DANS DES BANDES DE COUCHES MINCES D'AL (fr)
- Author
- KINSBRON E
BELL LAB./MURRAY HILL NJ 07974/USA - Source
- APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 36; NO 12; PP. 968-970; BIBL. 8 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- COUCHE MINCE DIFFUSION ELECTRODIFFUSION EPAISSEUR RUPTURE DUREE VIE DENSITE COURANT MICROSTRUCTURE CONTRAINTE MODELE MATHEMATIQUE METAL PUR AL ALLIAGE2 AL:>50 CU:3-5 ALLIAGE2 AL:>50 CU:0,5-1 ALUMINIUM METAL METALLURGIE PHYSIQUE SOLIDE
- Keyword (en)
- THIN FILM DIFFUSION ELECTRODIFFUSION THICKNESS RUPTURE LIFETIME CURRENT DENSITY MICROSTRUCTURE ULTRASTRUCTURE MATHEMATICAL MODELS ALUMINUM METAL METALLURGY SOLID PHYSICS
- Keyword (es)
- METALURGIA FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Metals. Metallurgy Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8100153268
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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