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A TECHNICAL ASSESSMENT OF ELECTRON OPTICAL SYSTEMS

Other title
REVUE TECHNIQUE DES SYSTEMES ELECTRONIQUES OPTIQUES (fr)
Author
RIGSBEE JM
UNIV. ILLINOIS/URBANA IL/USA
Source
J. MET.; ISSN 0022-2674; USA; DA. 1981; VOL. 33; NO 3; PP. 13-19; BIBL. 18 REF.
Document type
Article
Language
English
Keyword (fr)
MICROANALYSE METALLOGRAPHIE QUANTITATIVE MICROSCOPIE ELECTRONIQUE BALAYAGE MICROSONDE SPECTROMETRIE AUGER ANALYSE RAYONS X COMPARAISON MICROSCOPE TRANSMISSION SPECTROMETRIE DISPERSIVE METALLURGIE
Keyword (en)
MICROANALYSIS QUANTITATIVE METALLOGRAPHY SCANNING ELECTRON MICROSCOPY MICROPROBE AUGER ELECTRON SPECTROMETRY AUGER SPECTROSCOPY X RAY ANALYSIS TRANSMISSION MICROSCOPE DISPERSIVE SPECTROMETRY METALLURGY
Keyword (es)
METALURGIA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy

Discipline
Metals. Metallurgy
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8100415032

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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