A TECHNICAL ASSESSMENT OF ELECTRON OPTICAL SYSTEMS
- Other title
- REVUE TECHNIQUE DES SYSTEMES ELECTRONIQUES OPTIQUES (fr)
- Author
- RIGSBEE JM
UNIV. ILLINOIS/URBANA IL/USA - Source
- J. MET.; ISSN 0022-2674; USA; DA. 1981; VOL. 33; NO 3; PP. 13-19; BIBL. 18 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- MICROANALYSE METALLOGRAPHIE QUANTITATIVE MICROSCOPIE ELECTRONIQUE BALAYAGE MICROSONDE SPECTROMETRIE AUGER ANALYSE RAYONS X COMPARAISON MICROSCOPE TRANSMISSION SPECTROMETRIE DISPERSIVE METALLURGIE
- Keyword (en)
- MICROANALYSIS QUANTITATIVE METALLOGRAPHY SCANNING ELECTRON MICROSCOPY MICROPROBE AUGER ELECTRON SPECTROMETRY AUGER SPECTROSCOPY X RAY ANALYSIS TRANSMISSION MICROSCOPE DISPERSIVE SPECTROMETRY METALLURGY
- Keyword (es)
- METALURGIA
- Classification
- Discipline
- Metals. Metallurgy
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8100415032
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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