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DETERMINATION OF THE TRUE TOTAL LINE INTENSITY AND THE TRUE HALFWIDTH OF THE LORENTZ COMPONENT FOR THE CLASS OF VOIGT PROFILES FROM GRAPHICAL ANALYSIS OF SPECTRUM

Author
LOKNER V; MOVRE M
UNIV., INST. PHYS./ZAGREB/YUG
Source
FIZIKA; YUG; DA. 1980; VOL. 12; NO 1; PP. 61-69; ABS. YUG; BIBL. 9 REF.
Document type
Article
Language
English
Keyword (fr)
PROFIL RAIE SPECTRALE ANALYSE SPECTRE METHODE GRAPHIQUE SPECTROMETRIE OPTIQUE PLASMA DIAGNOSTIC PLASMA RAIE SPECTRALE INTENSITE PROFIL VOIGT METROLOGIE PHYSIQUE THEORIQUE PHYSIQUE DES PLASMAS
Keyword (en)
SPECTRAL LINE PROFILE SPECTRUM ANALYSIS GRAPHIC METHOD OPTICAL SPECTROMETRY OPTICAL SPECTROSCOPY PLASMA PLASMA DIAGNOSTIC SPECTRAL LINE INTENSITY MEASUREMENT SCIENCE THEORETICAL PHYSICS PLASMA PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA FISICA DE LAS PLASMAS
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics

Discipline
Atomic and molecular physics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130006010

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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