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CIRCUIT IMPLEMENTATION OF FUSIBLE REDUNDANT ADDRESSES ON RAMS FOR PRODUCTIVITY ENHANCEMENT

Author
FITZGERALD BF; THOMA EP
I.B.M., GEN. TECH. DIVISION LAB./ESSEX JUNCTION VT 05425/USA
Source
I.B.M. J. RES. DEVELOP.; USA; DA. 1980; VOL. 24; NO 3; PP. 291-298; BIBL. 13 REF.
Document type
Article
Language
English
Keyword (fr)
MEMOIRE ACCES DIRECT CIRCUIT REDONDANCE STOCKAGE INFORMATION MEMOIRE IMPLANTATION FIABILITE ESSAI TEST CIRCUIT INFORMATIQUE MATHEMATIQUES APPLIQUEES ELECTRONIQUE
Keyword (en)
RANDOM ACCESS MEMORY(RAM) CIRCUIT REDUNDANCY INFORMATION STORAGE MEMORY RELIABILITY TEST COMPUTER SCIENCES APPLIED MATHEMATICS ELECTRONICS
Keyword (es)
INFORMATICA MATEMATICAS APPLICADAS ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics Mathematics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130023742

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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