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ROTATION-, SHIFT-, AND MAGNIFICATION-INSENSITIVE PERIODIC-PATTERN-DEFECTS OPTICAL DETECTION SYSTEM

Author
IWAMOTO A; SEKIZAWA H
TOSHIBA CORP./SAIWAIKU KAWASAKI 210/JPN
Source
APPL. OPT.; USA; DA. 1980; VOL. 19; NO 7; PP. 1196-1200; BIBL. 4 REF.
Document type
Article
Language
English
Keyword (fr)
DETECTION DEFAUT FILTRAGE FREQUENCE SPATIALE FILTRE FREQUENCE SPATIALE SYSTEME OPTIQUE CONTROLE AUTOMATIQUE RECONNAISSANCE FORME STRUCTURE PERIODIQUE CIRCUIT INTEGRE DEFAUT OPTIQUE ELECTRONIQUE
Keyword (en)
DEFECT DETECTION SPATIAL FREQUENCY FILTERING SPATIAL FREQUENCY FILTERS OPTICAL SYSTEM AUTOMATIC MONITORING PATTERN RECOGNITION PERIODIC STRUCTURE INTEGRATED CIRCUIT DEFECT OPTICS ELECTRONICS
Keyword (es)
OPTICA ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130053393

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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