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COMPARISON OF LEED AND AUGER DATA FROM CLEAVED AND SPUTTERED-ANNEALED INP(110) SURFACES

Author
TSANG JC; KAHN A; MARK P
PRINCETON UNIV., DEP. ELECTR. ENG./PRINCETON NJ 08544/USA
Source
SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 97; NO 1; PP. 119-127; BIBL. 18 REF.
Document type
Article
Language
English
Keyword (fr)
METAL GROUPE IIIB COMPOSE COMPOSE MINERAL ANALYSE DEL SPECTROMETRIE AUGER CLIVAGE POLISSAGE MECANIQUE PULVERISATION RECUIT FACE CRISTALLINE STRUCTURE SURFACE TRAITEMENT SURFACE INDIUM PHOSPHURE CRISTALLOGRAPHIE
Keyword (en)
INORGANIC COMPOUND AUGER ELECTRON SPECTROMETRY AUGER SPECTROSCOPY CLEAVAGE MECHANICAL POLISHING SPRAYING ANNEALING CRYSTAL FACE SURFACE STRUCTURE SURFACE TREATMENT INDIUM PHOSPHIDE CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130058830

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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