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CONTACT RELIABILITY STUDIES ON LEAD-SALT DIODE LASERS

Author
LO W; GIFFORD FE
GENERAL MOTORS RES. LAB./WARREN MI 48090/USA
Source
J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1980; VOL. 127; NO 6; PP. 1372-1375; BIBL. 18 REF.
Document type
Article
Language
English
Keyword (fr)
LASER SEMICONDUCTEUR FIABILITE LASER INJECTION DETERIORATION ETAIN PLOMB TELLURURE MIXTE PLOMB SOUFRE SELENIURE MIXTE OPTIQUE
Keyword (en)
SEMICONDUCTOR LASER RELIABILITY INJECTION LASER DETERIORATION OPTICS
Keyword (es)
OPTICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130061171

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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