Pascal and Francis Bibliographic Databases

Help

Permanent link : http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL8130063559

Export

Selection :

EDC CHIP BOOSTS MEMORY RELIABILITY

Author
TATE G; MILLER W
ADVANCED MICRO DEVICES INC./SUNNYVALE CA 94086/USA
Source
ELECTRON. DESIGN; USA; DA. 1980; VOL. 28; NO 18; PP. 151-155; BIBL. 9 REF.
Document type
Article
Language
English
Keyword (fr)
FIABILITE MEMOIRE CORRECTION ERREUR DETECTION ERREUR CIRCUIT INTEGRE FIABILITE SYSTEME PUCE INFORMATIQUE MATHEMATIQUES APPLIQUEES
Keyword (en)
RELIABILITY MEMORY ERROR CORRECTION ERROR DETECTION INTEGRATED CIRCUIT SYSTEM RELIABILITY CHIP COMPUTER SCIENCES APPLIED MATHEMATICS
Keyword (es)
INFORMATICA MATEMATICAS APPLICADAS
Classification
Pascal
001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics

Discipline
Mathematics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130063559

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web