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COMPARISON OF HOLLOW CONE AND AXIAL BRIGHT FIELD ELECTRON MICROSCOPE IMAGING TECHNIQUES

Author
FREEMAN LA; HOWIE A; MISTRY AB
CAVENDISH LAB./CAMBRIDGE/GBR
Source
J. MICR.; GBR; DA. 1980; VOL. 119; NO 1; PP. 3-18; BIBL. 31 REF.
Document type
Article
Language
English
Keyword (fr)
MICROSCOPIE ELECTRONIQUE MICROSCOPIE CHAMP CLAIR HAUTE RESOLUTION MATERIAU AMORPHE ETUDE COMPARATIVE CONTRASTE ILLUMINATION CONE CREUX ILLUMINATION AXIALE METROLOGIE PHYSIQUE THEORIQUE ELECTRONIQUE
Keyword (en)
ELECTRON MICROSCOPY HIGH-RESOLUTION METHODS AMORPHOUS MATERIAL COMPARATIVE STUDY CONTRAST MEASUREMENT SCIENCE THEORETICAL PHYSICS ELECTRONICS
Keyword (es)
METROLOGIA FISICA TEORICA ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130068567

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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