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A MOLYBDENIUM SOURCE, GATE AND DRAIN METALLIZATION SYSTEM FOR GAAS MESFET LAYERS GROWN BY MOLECULAR BEAM EPITAXY

Author
DEVLIN WJ; WOOD CEC; STALL R; EASTMAN LF
CORNELL UNIV., SCH. ELECTR. ENG./ITHACA NY 14853/USA
Source
SOLID-STATE ELECTRON.; GBR; DA. 1980; VOL. 23; NO 8; PP. 823-829; BIBL. 33 REF.
Document type
Article
Language
English
Keyword (fr)
TRANSISTOR EFFET CHAMP METALLISATION COUCHE EPITAXIQUE TRANSISTOR EFFET CHAMP BARRIERE SCHOTTKY CONDENSATION FAISCEAU MOLECULAIRE DEPOT METHODE PHASE VAPEUR PREPARATION FABRICATION GALLIUM ARSENIURE MOLYBDENE ELECTRONIQUE
Keyword (en)
FIELD EFFECT TRANSISTOR METALLIZING EPITAXIAL FILM METAL SEMICONDUCTOR FIELD EFFECT TRANSISTOR MOLECULAR BEAM CONDENSATION GROWTH FROM VAPOR PREPARATION MOLYBDENUM ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130096060

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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