ELECTRIC PROBE MEASUREMENTS ON MICROSTRIP
- Author
- DAHELE JS; CULLEN AL
CHINESE UNIV. HONG KONG, ELECTRON. DEP./SHATIN/HKG - Source
- I.E.E.E. TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1980; VOL. 28; NO 7; PP. 752-755; BIBL. 5 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- LIGNE HYPERFREQUENCE LIGNE MICROBANDE CHAMP ELECTRIQUE MESURE ELECTRONIQUE
- Keyword (en)
- MICROWAVE LINE MICROSTRIP LINE ELECTRICAL FIELD MEASUREMENT ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130129228
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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