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DETERMINING THE OPTICAL PARAMETERS OF THIN FILMS: REEVALUATION OF A NEW METHOD

Author
SHAMIR J; DEMNER Y
TECHNION-ISRAEL INST. TECHNOL./HAIFA 32000/ISR
Source
APPL. OPT.; USA; DA. 1980; VOL. 19; NO 16; PP. 2658-2660; BIBL. 4 REF.
Document type
Article
Language
English
Keyword (fr)
PROPRIETE OPTIQUE COUCHE MINCE CONSTANTE OPTIQUE METHODE MESURE EPAISSEUR METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
OPTICAL PROPERTIES THIN FILM OPTICAL CONSTANT MEASUREMENT METHOD THICKNESS MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130130763

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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