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http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL8130133032

A NOVEL ELECTRO-OPTICAL TECHNIQUE IN METROLOGY

Author
FALKNER AH
LANCHESTER POLYTECH./COVENTRY/GBR
Source
EEO '78. EUROPEAN ELECTRO-OPTICS CONFERENCE. 4/1978/UTRECHT; USA; BELLINGHAM: SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS; DA. 1979; PP. 197-200; BIBL. 3 REF.
Document type
Conference Paper
Language
English
Keyword (fr)
DISPOSITIF ELECTROOPTIQUE PLAQUE PERFOREE TROU POSITION PROFIL MESURE DIMENSION METHODE MESURE OPTIQUE METROLOGIE METROLOGIE PHYSIQUE THEORIQUE INDUSTRIE MECANIQUE
Keyword (en)
ELECTROOPTICAL DEVICE PERFORATED PLATE HOLE POSITION PROFILE MEASUREMENT DIMENSIONS OPTICAL MEASUREMENT METHOD METROLOGY MEASUREMENT SCIENCE THEORETICAL PHYSICS MECHANICAL ENGINEERING
Keyword (es)
METROLOGIA FISICA TEORICA INDUSTRIA MECANICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D12 Mechanical engineering. Machine design

Discipline
Mechanical engineering. Mechanical construction. Handling Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130133032

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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