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MEASUREMENT OF S.A.W. DEVICE STRIPE/PERIOD RATIO USING OPTICAL DIFRACTION

Author
CHAPMAN CW; JUDD GW
HUGHES AIRCRAFT CO/FULLERTON CA 92634/USA
Source
ELECTRON. LETT.; GBR; DA. 1980; VOL. 16; NO 25-26; PP. 952-953; BIBL. 4 REF.
Document type
Article
Language
English
Keyword (fr)
CIRCUIT ONDE ACOUSTIQUE ONDE SURFACE STRUCTURE PERIODIQUE PARAMETRE CIRCUIT MESURE DIFFRACTION OPTIQUE FAISCEAU LASER DISPOSITIF ONDE ACOUSTIQUE TRANSDUCTEUR CONFIGURATION INTERDIGITALE ELECTRONIQUE
Keyword (en)
ACOUSTIC WAVE CIRCUIT SURFACE WAVES PERIODIC STRUCTURE CIRCUIT PARAMETER MEASUREMENT OPTICAL DIFFRACTION LASER BEAM ACOUSTIC WAVE DEVICE TRANSDUCER INTERDIGITAL CONFIGURATION ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130151365

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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