SYSTEM FOR COMBINED SIMS-AES-XPS STUDIES OF SOLIDS
- Author
- FRISCH MA; REUTER W; WITTMAACK K
IBM THOMAS J. WATSON RES. CENT./YORKTOWN HEIGHTS NY 10598/USA - Source
- REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 6; PP. 695-704; BIBL. 24 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- SPECTROMETRIE SIMS SPECTROMETRIE AUGER SPECTROMETRIE PHOTOELECTRON APPAREILLAGE METHODE ETUDE SURFACE COUCHE MINCE RAYON X CRISTALLOGRAPHIE
- Keyword (en)
- SECONDARY ION MASS SPECTROMETRY AUGER ELECTRON SPECTROMETRY AUGER SPECTROSCOPY PHOTOELECTRON SPECTROMETRY INVESTIGATION METHOD SURFACE THIN FILM X-RAYS CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130154667
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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Europe PubMed Central access
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