A NEW MECHANISM FOR HIGH-FREQUENCY RECTIFICATION AT LOW TEMPERATURES IN POINT CONTACTS BETWEEN IDENTICAL METALS
- Author
- VAN DER HEIJDEN RW; JANSEN AGM; STOELINGA JHM; SWARTJES HM; WYDER P
UNIV. NIJMEGEN, RES. INST. MATERIALS/NIJMEGEN 6525/NLD - Source
- APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 2; PP. 245-248; BIBL. 20 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- OPTIQUE NON LINEAIRE RECTIFICATION OPTIQUE RAYONNEMENT IR LOINTAIN ONDE SUBMILLIMETRIQUE BASSE TEMPERATURE CONTACT PONCTUEL METAL DETECTEUR RAYONNEMENT RAYONNEMENT IR HYPERFREQUENCE CONTACT METAL METAL TENSION POLARISATION OPTIQUE ELECTRONIQUE
- Keyword (en)
- NON LINEAR OPTICS FAR INFRARED RADIATION SUBMILLIMETRIC WAVE LOW TEMPERATURE POINT CONTACT METAL RADIATION DETECTOR INFRARED RADIATION MICROWAVE METAL METAL CONTACT BIAS VOLTAGE OPTICS ELECTRONICS
- Keyword (es)
- OPTICA ELECTRONICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Electronics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130159984
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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